This page contains links to many of our resources and technical information.
Click on the html links to view page online or click on the pdf* links to view the Adobe Acrobat PDF versions.
*pdf files are opened by Adobe Acrobat Reader. To get it, free, click here.

Technical Notes:
		Concerning the Measurement of P-well and N-well Surfaces
		Converting Resistivity to Carrier Concentration - JavaScript Calculator.
		Converting Resistivity to Carrier Concentration - Graph
		Depth Resolution - JavaScript Calculator.
		The Desirability of Dedicated Spreading Resistance Test Patterns
		SRA Tutorial: Determination of Diffusion Characteristics Using 2&4 Point Probe Measurements
		Doping Type Determination
		Dose, Sheet and 4 Point Probe
		Electrically Active and Inactive Phosphorus - a SRA and SIMS comparison
		Epi Resistivity as an Indication of Silane Purity
		Gallery of Four Point Probe Measurements
		How Big a Pattern Do We Need For SRA?
		How Do We Calculate Carrier Concentration?
		Maximum Depth of Interest and Related Matters
		Profiling Poly
		SRP and SIMS
		Profiling Rough Surfaces
		Profiling Rough Surfaces (Expanded)
		Sampling Volume Correction
		Using Our Poisson Solver to Calculate Dopant Profiles
Seminars:
		Seminar in Power Point Dec 2007
		Corporate Seminar Nov 2004
		Corporate Seminar June 2003
Newsletters:
		August 2006
		August 2005
		30th Anniversary 2005
		December 2001
		November 1999
Published Papers: *
		A Poisson Solver for SRA (© AVS 1992)
		Geometric Effects Contributing To Anticipation Of The Bevel Edge In Spreading Resistance Profiling (© Solecon Labs 1995)
		Developments in Ultrashallow SRA (© AVS 2002)

* Where possible, we ask that you support the technical community by purchasing a copy using the JVST link. Then click the pdf link to get the updated versions of the papers.